Tai-Hsiang Lai

ESD Robustness of 40-V CMOS Devices With/Without Drift Implant

Ming-Dou Ker, Tien-Hao Tang, Kuan-Cheng Su, 2006, 2006 IEEE International Integrated Reliability Workshop Final Report.

Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology

Ming-Dou Ker, Tai-Hsiang Lai, 2008, IEEE Transactions on Electromagnetic Compatibility.

Design of modified ESD protection structure with low-trigger and high-holding voltage in embedded high voltage CMOS process

Tien-Hao Tang, Kuan-Cheng Su, Tai-Hsiang Lai, 2011, 2011 International Reliability Physics Symposium.

The modified P+ electrode layout schemes to enhance esd robustness of SCR structure for PMIC applications

Tien-Hao Tang, Kuan-Cheng Su, Chang-Tzu Wang, 2011, 2011 International Reliability Physics Symposium.

High-robust ESD protection structure with embedded SCR in high-voltage CMOS process

Ming-Dou Ker, Tien-Hao Tang, Kuan-Cheng Su, 2008, 2008 IEEE International Reliability Physics Symposium.