Y.-S. Lai

Advances in the drop-impact reliability of solder joints for mobile applications

Willem D. van Driel, N. Owens, Ee-Hua Wong, 2009, Microelectron. Reliab..

Robust lossless image watermarking based on alpha-trimmed mean algorithm and support vector machine

Y.-S. Lai, H.-H. Tsai, H.-C. Tseng, 2010, J. Syst. Softw..

Correlation studies for component level ball impact shear test and board level drop test

Willem D. van Driel, N. Owens, Ee-Hua Wong, 2008, Microelectron. Reliab..

Recent advances in drop-impact reliability

E.H. Wong, W.D. van Driel, J.F.J.M. Caers, 2008, EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems.