Tohru Ishitani

发表

Use of two focusing modes on two-lens focused ion-beam column

Tohru Ishitani, Yoshimi Kawanami, 1995, Optics & Photonics.

A method for personal expertise-independent evaluation of image resolution in scanning electron microscopy.

Tohru Ishitani, Mitsugu Sato, M. Sato, 2006, Scanning.

Focused ion-beam-assisted deposition of tungsten

Tsuyoshi Ohnishi, Tohru Ishitani, Yuichi Madokoro, 1990, Advanced Lithography.

Simulation of secondary electron emission in helium ion microscope for overcut and undercut line-edge patterns

Tohru Ishitani, Takuya Yamanaka, K. Inai, 2009, Advanced Lithography.

Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy.

Tohru Ishitani, Mitsugu Sato, M. Sato, 2007, Journal of electron microscopy.

Proposals for exact-point transmission-electron microscopy using focused ion beam specimen-preparation technique

Tohru Ishitani, Hidemi Koike, Shigeto Isakozawa, 1998 .

Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy.

Tohru Ishitani, Mitsugu Sato, M. Sato, 2004, Journal of electron microscopy.

Evaluation of depth of field in SEM images in terms of the information-passing capacity (IPC) and contrast gradient in SEM image

Tohru Ishitani, Mitsugu Sato, Mine Nakagawa, 2004 .

Micromachining and Device Transplantation Using Focused Ion Beam

Tsuyoshi Ohnishi, Tohru Ishitani, 1991 .

Comparison of secondary electron emission in helium ion microscope with gallium ion and electron microscopes

Tohru Ishitani, Takuya Yamanaka, Kaoru Ohya, 2009 .

Proposal for Device Transplantation using a Focused Ion Beam

Tsuyoshi Ohnishi, Tohru Ishitani, Yoshimi Kawanami, 1990 .

A method for multidirectional TEM observation of a specific site at atomic resolution.

Tsuyoshi Ohnishi, Tohru Ishitani, Toshie Yaguchi, 2004, Journal of electron microscopy.

Micromachining and Device Transplantation Using Focused Ion Beam

Tsuyoshi Ohnishi, Tohru Ishitani, Yoshimi Kawanami, 1990 .

Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy.

Tohru Ishitani, Mitsugu Sato, Chisato Kamiya, 2005, Journal of electron microscopy.

Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy

Tohru Ishitani, Mitsugu Sato, 2002 .

Simulation study on image contrast and spatial resolution in helium ion microscope.

Tohru Ishitani, Kaoru Ohya, K. Ohya, 2007, Journal of electron microscopy.