Stewart E. Rauch

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs

Prateek Sharma, Tibor Grasser, Jacopo Franco, 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC).

Modeling stress-induced void growth in Al-4wt%Cu lines

Timothy D. Sullivan, Stewart E. Rauch, 1993, Other Conferences.

Outstanding Conference Paper Award 2009 IEEE Nuclear and Space Radiation Effects Conference

Jonathan A. Pellish, David F. Heidel, Kenneth A. LaBel, 2009 .