Christian Walczyk

Selective Epitaxy of Si/SiGe to Improve pMOS Devices by Recessed Source/Drain and/or Buried SiGe Channels

Akira Inoue, Rita Rooyackers, Denis Shamiryan, 2006 .

Side channel attacks and the non volatile memory of the future

Zoya Dyka, Peter Langendörfer, Christian Wenger, 2012, CASES '12.

RRAM Reliability/Performance Characterization through Array Architectures Investigations

Piero Olivo, Cristian Zambelli, Alessandro Grossi, 2015, 2015 IEEE Computer Society Annual Symposium on VLSI.

Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions

Piero Olivo, Rolf Kraemer, Cristian Zambelli, 2014, 2014 IEEE 6th International Memory Workshop (IMW).

Statistical analysis of resistive switching characteristics in ReRAM test arrays

Piero Olivo, Cristian Zambelli, Alessandro Grossi, 2014, 2014 International Conference on Microelectronic Test Structures (ICMTS).

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Piero Olivo, Cristian Zambelli, Alessandro Grossi, 2016 .

Method and apparatus for cleaning the fountain solution of a printing press

Christian Walczyk, Christian Brüggemann, Jürgen Mackel, 2004 .

Graphene based electron field emitter

Christian Wenger, Mirko Fraschke, Johann W. Bartha, 2015 .

(Invited) Resistive Switching and Current Status of HfO2-based RRAM

Malgorzata Sowinska, Thomas Schroeder, Christian Walczyk, 2014 .

In-operando and non-destructive analysis of the resistive switching in the Ti/HfO2/TiN-based system by hard x-ray photoelectron spectroscopy

Malgorzata Sowinska, Thomas Schroeder, Christian Walczyk, 2012 .

Resistive switching characteristics of integrated polycrystalline hafnium oxide based one transistor and one resistor devices fabricated by atomic vapor deposition methods

Felice Crupi, Christian Wenger, A. Trusch, 2015 .