Hidetoshi Iwai

Statistical analysis of dynamic-random-access-memory data-retention characteristics

Atsushi Hiraiwa, Yutaka Itoh, Makoto Ogasawara, 1997, Advanced Lithography.

Dual-period self-refresh scheme for low-power DRAM's with on-chip PROM mode register

Youji Idei, Katsuhiro Shimohigashi, Katsuyuki Sato, 1998 .

Field-effect trap-level-distribution model of dynamic random access memory data retention characteristics

Atsushi Hiraiwa, Hidetoshi Iwai, A. Hiraiwa, 1997 .