K. Hirabayashi

Delay fault simulation of self-checking error checkers

K. Hirabayashi, 1991, [Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems.

Effects of Surface Orientation on Transport Properties of Electrons and Holes on Oxidized Silicon Surfaces

K. Hirabayashi, Y. Takeishi, T. Satô, 1972 .