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Survivability risk analysis and cost comparison of SONET architectures

J. Healy, R. Doverspike, Y. Kane-Esrig, 1992, [Conference Record] GLOBECOM '92 - Communications for Global Users: IEEE.

All electronic defect inspection, management, and reporting system

D. Kolar, T. R. White, J. Brenizer, 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).