Brian T. Murray

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Design of built-in test generator circuits using width compression

Krishnendu Chakrabarty, Brian T. Murray, 1998, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

AN ADAPTABLE SOFTWARE SAFETY PROCESS FOR AUTOMOTIVE SAFETY-CRITICAL SYSTEMS. IN: CAE METHODS FOR VEHICLE CRASHWORTHINESS AND OCCUPANT SAFETY, AND SAFETY-CRITICAL SYSTEMS

Joseph G. D'Ambrosio, Brian T. Murray, Barbara J. Czerny, 2004 .

Codesign of architectures for automotive powertrain modules

Xiaobo Sharon Hu, Dah-Lain Tang, Joseph G. D'Ambrosio, 1994, IEEE Micro.

Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters

Krishnendu Chakrabarty, Vikram Iyengar, Brian T. Murray, 2000, IEEE Trans. Very Large Scale Integr. Syst..

Time-constrained failure diagnosis in distributed embedded systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 2002, Proceedings International Conference on Dependable Systems and Networks.

Dependable Communication Synthesis for Distributed Embedded Systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 2003, SAFECOMP.

Test width compression for built-in self testing

Jian Liu, Krishnendu Chakrabarty, Brian T. Murray, 1997, Proceedings International Test Conference 1997.

Scalable Test Generators for High-Speed Datapath Circuits

John P. Hayes, Hussain Al-Asaad, Brian T. Murray, 1998, J. Electron. Test..

Tolerating transient faults in statically scheduled safety-critical embedded systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 1999, Proceedings of the 18th IEEE Symposium on Reliable Distributed Systems.

Hierarchical test generation using precomputed tests for modules

John P. Hayes, Brian T. Murray, J. Hayes, 1990, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Dependable communication synthesis for distributed embedded systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 2003, Reliab. Eng. Syst. Saf..

Time-constrained failure diagnosis in distributed embedded systems: application to actuator diagnosis

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 2005, IEEE Transactions on Parallel and Distributed Systems.

Hierarchical testing using precomputed tests for modules

Brian T. Murray, 1995 .

Optimal space compaction of test responses

John P. Hayes, Krishnendu Chakrabarty, Brian T. Murray, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

Optimal Zero-Aliasing Space Compaction of Test Responses

John P. Hayes, Krishnendu Chakrabarty, Brian T. Murray, 1998, IEEE Trans. Computers.

Test Propagation Through Modules and Circuits

John P. Hayes, Brian T. Murray, J. Hayes, 1991, 1991, Proceedings. International Test Conference.

Hierarchical test generation using precomputed testsd for modules

John P. Hayes, Brian T. Murray, J. Hayes, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

Built-in self testing of sequential circuits using precomputed test sets

Krishnendu Chakrabarty, Vikram Iyengar, Brian T. Murray, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

Deterministic Built-in Pattern Generation for Sequential Circuits

Krishnendu Chakrabarty, Vikram Iyengar, Brian T. Murray, 1999, J. Electron. Test..

Huffman encoding of test sets for sequential circuits

Krishnendu Chakrabarty, Vikram Iyengar, Brian T. Murray, 1998, IEEE Trans. Instrum. Meas..

Web Services Base Notification 1.3 (WS-BaseNotification)

Brian T. Murray, David A. Hull, Stephen M. Graham, 2006 .

Smart Sensors for Future Robust Systems

Brian T. Murray, Michel F. Sultan, David S. Eddy, 2000 .

Self-organization and geometric properties of polygonal fracture networks

Basil Tikoff, Brian T. Murray, Patrick F. Riley, 2008 .

Task Scheduling Algorithms for Fault Tolerance in Real-Time Embedded Systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 2000 .

High-level test generation for VLSI

John P. Hayes, Brian T. Murray, Debashis Bhattacharya, 1989, Computer.

Low-cost on-line fault detection using control flow assertions

John P. Hayes, Brian T. Murray, Rajesh Venkatasubramanian, 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..

Transparent recovery from intermittent faults in time-triggered distributed systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray, 2003 .

Hardware topologies for electrically operated brake calipers and steering motor a safety system

Brian T. Murray, Scott A. Millsap, Sanket S. Amberkar, 2000 .

Reinventing class discussion online

Brian T. Murray, 2000 .

TDSD2 - A Highly Integrated Decoder For Nicam-728

Brian T. Murray, Mark A. Glover, 1991, 1991 IEEE International Conference on Consumer Electronics.

Effective Application of Software Safety Techniques for Automotive Embedded Control Systems

Joseph G. D'Ambrosio, Brian T. Murray, Barbara J. Czerny, 2005 .

Providing convincing evidence of safety in X-by-wire automotive systems

Joseph G. D'Ambrosio, Brian T. Murray, Barbara J. Czerny, 2000, Proceedings. Fifth IEEE International Symposium on High Assurance Systems Engineering (HASE 2000).

Built-in test pattern generation for high-performance circuits using twisted-ring counters

Krishnendu Chakrabarty, Vikram Iyengar, Brian T. Murray, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

An AIS-based deep learning framework for regional ship behavior prediction

Lokukaluge P. Perera, Brian T. Murray, L. Perera, 2021, Reliab. Eng. Syst. Saf..

Development experience with steer-by-wire

Brian T. Murray, Brian T. Murray, Tim Kaufmann, 2001 .