M. Perkins

Traceability for on-wafer s-parameter measurements

D. J. Bannister, M. Perkins, 1992 .

Improved six-port reflectometer based on symmetrical five-port junction

D. J. Bannister, J. P. Ide, M. Perkins, 1992 .

Dielectric frequency response measurement as a tool for troubleshooting insulation power factor problems

G. Frimpong, M. Perkins, A. Fazlagic, 2002, Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316).