Martin Sauter

发表

Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements

Martin Sauter, Martin Sauter, 2005, Microelectron. Reliab..

From GSM to LTE-Advanced: Sauter/From GSM to LTE-Advanced

Martin Sauter, 2014 .

Airborne Thermal Data Identifies Groundwater Discharge at the North-Western Coast of the Dead Sea

Martin Sauter, Stefan Geyer, Richard Gloaguen, 2013, Remote. Sens..

Simulation and modelling of VDMOSFET self protection under TLP-stress

Martin Sauter, Joost Willemen, 2010, Microelectron. Reliab..

How to build a Generic Model of complete ICs for system ESD and electrical stress simulation?

Martin Sauter, Linus Maurer, Andreas Rupp, 2017, 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Application Example of a Novel Methodology to Generate IC Models for System ESD and Electrical Stress Simulation out of the Design Data

Martin Sauter, Linus Maurer, Andreas Rupp, 2019, 2019 41st Annual EOS/ESD Symposium (EOS/ESD).

A novel modeling approach using arbitrary Lagrangian-Eulerian (ALE) method for the flow simulation in unconfined aquifers

Martin Sauter, Ekkehard Holzbecher, Yulan Jin, 2014, Comput. Geosci..

Characterizing and Modelling Common Mode Inductors at high Current Levels for System ESD Simulations

Martin Sauter, Linus Maurer, Andreas Rupp, 2019, 2019 41st Annual EOS/ESD Symposium (EOS/ESD).

Bringing the SEED Approach to the Next Level: Generating IC Models for System ESD and Electrical Stress Simulation out of Design Data

Martin Sauter, Linus Maurer, Yiqun Cao, 2020, IEEE Transactions on Electromagnetic Compatibility.

On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP)

Martin Sauter, Matthias Stecher, David Johnsson, 2011, Microelectron. Reliab..

Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents

Martin Sauter, Klaus-Willi Pieper, 2001, Microelectron. Reliab..