Christopher Hess

发表

Digital tester-based measurement methodology for process control in multilevel metallization systems

Larg Weiland, Christopher Hess, 1995, Advanced Lithography.

Test time reduction methods for yield test structures

Larg Weiland, Christopher Hess, H. Read, 2003, International Conference on Microelectronic Test Structures, 2003..

Session 1: Design margin

Christopher Hess, Emilio Lora-Tamayo, 2012, ICMTS 2012.

Fast extraction of defect size distribution using a single layer short flow NEST structure

Christopher Hess, Gaurav Verma, D. Stashower, 2001 .

Device ArrayScribe Characterization Vehicle TestChip forUltra FastProduct WaferVariability Monitoring

Christopher Hess, Senthil Subramanian, Stefano Tonello, 2007 .

Extraction of wafer-level defect density distributions to improve yield prediction

Christopher Hess, L. H. Weiland, C. Hess, 1999, ICMTS 1999.

AIRCRAFT IN THE NETWORK.

Christopher Hess, 2001 .

AIRBAGS IN SEAT BELTS: MORE SAFETY FOR PASSENGERS.

Christopher Hess, 1999 .

Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits

Larg Weiland, Christopher Hess, K. Sawada, 2002, Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002..

Direct probing characterization vehicle test chip for wafer level exploration of transistor pattern on product chips

Christopher Hess, Hans Eisenmann, Larg Weiland, 2014, 2014 International Conference on Microelectronic Test Structures (ICMTS).

Fast extraction of killer defect density and size distribution using a single layer short flow NEST structure

Larg Weiland, Christopher Hess, Brian E. Stine, 2000, ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).

Remembrance of transistors past: Compact model parameter extraction using bayesian inference and incomplete new measurements

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2014, 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC).

Advanced Semiconductor Manufacturing Conference

Larg Weiland, Christopher Hess, C. Hess, 2002, ASMC 2002.

Stackable short flow Characterization Vehicle test chip to reduce test chip designs, mask cost and engineering wafers

Christopher Hess, Amit Joag, Sa Zhao, 2010, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Characterization and modeling of MOSFET mismatch of a deep submicron technology

S. Minehane, Christopher Hess, H. Karbasi, 2003, International Conference on Microelectronic Test Structures, 2003..

Defect cluster analysis to detect equipment-specific yield loss based on yield-to-area calculations

Larg Weiland, Christopher Hess, 1997, Advanced Lithography.

Statistical library characterization using belief propagation across multiple technology nodes

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2015, 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Compact Model Parameter Extraction Using Bayesian Inference, Incomplete New Measurements, and Optimal Bias Selection

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2016, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Addressable failure site test structures (AFS-TS) for CMOS processes: Design guidelines, fault simulation, and implementation

Ding-Ming Kwai, Charles Ching-Hsiang Hsu, Larg Weiland, 2001 .

2 - Keynote Address: Next Generation Semiconductor Factory: Challenges and Opportunities

Mark Nelson, Christopher Hess, Jason D. Hibbeler, 2007 .

Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips

Dennis Ciplickas, Christopher Hess, Rakesh Vallishayee, 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).

Methodology for Construction of a T-Pose 3D Human Model

Christopher Hess, Isiah Davenport, Eric Ennis, 2013 .

Guest editorial special section on the advanced semiconductor manufacturing conference

Christopher Hess, L. H. Weiland, 2002 .

Correlation between particle defects and electrical faults determined with laser scattering systems and digital measurements on checkerboard test structures

Larg Weiland, Christopher Hess, Guenter Lau, 1996, Advanced Lithography.

Product relevant device leakage scribe characterization vehicle test chip for efficient full wafer testing

Peng Zhao, Christopher Hess, Rakesh Vallishayee, 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.

Passive Multiplexer Test Structure For Fast and Accurate Contact and Via Fail-Rate Evaluation

Larg Weiland, Christopher Hess, Brian E. Stine, 2001 .