S Uznanski

Monte-Carlo Based Charge Sharing Investigations on a Bulk 65 nm RHBD Flip-Flop

S Uznanski, G Gasiot, P Roche, 2010, IEEE Transactions on Nuclear Science.

Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops

Jean-Luc Autran, S Uznanski, G Gasiot, 2010, IEEE Transactions on Nuclear Science.

Alpha-Particle Induced Soft-Error Rate in CMOS 130 nm SRAM

S Uznanski, G Gasiot, P Roche, 2011, IEEE Transactions on Nuclear Science.