J. P. Charles

A junction characterization for microelectronic devices quality and reliability

P. Mialhe, W. Tazibt, J. P. Charles, 2008, Microelectron. Reliab..

Process and conduction of interferometric phase for satellite images

Abdelkrim Khireddine, J. P. Charles, Salim Chelbi, 2012, Adv. Eng. Softw..