D. J. Kim

Interval Scan Inspection Technique for Contact Failure of Advanced DRAM Process using Electron Beam-Inspection System

Mari Nozoe, D. Y. Mun, J. H. Oh, 2012 .

A new junction termination technique using ICP RIE for ideal breakdown voltages

Nung-Pyo Hong, D. J. Kim, Kwyro Lee, 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.