Y. Ominami

Interval Scan Inspection Technique for Contact Failure of Advanced DRAM Process using Electron Beam-Inspection System

Mari Nozoe, D. Y. Mun, J. H. Oh, 2012 .

Structural and Electrical Characterization of Carbon Nanofibers for Interconnect Via Applications

M. Meyyappan, Y. Ominami, M. Suzuki, 2007, IEEE Transactions on Nanotechnology.