Deepak V. Kulkarni

Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

Takeshi Nakazawa, Deepak V. Kulkarni, Takeshi Nakazawa, 2018, IEEE Transactions on Semiconductor Manufacturing.

IC Substrate Package Yield Prediction Model and Layer Level Risk Assessment by Design Analysis

Takeshi Nakazawa, Deepak V. Kulkarni, Osborne A. Martin, 2016, IEEE Transactions on Semiconductor Manufacturing.

Anomaly Detection and Segmentation for Wafer Defect Patterns Using Deep Convolutional Encoder–Decoder Neural Network Architectures in Semiconductor Manufacturing

Takeshi Nakazawa, Deepak V. Kulkarni, Takeshi Nakazawa, 2019, IEEE Transactions on Semiconductor Manufacturing.

Schur's complement approach in computational plasticity

Deepak V. Kulkarni, Mathias Wallin, Daniel Torterelli, 2005 .

A Newton-Schur alternative to the consistent tangent approach in computational plasticity

Deepak V. Kulkarni, D. Tortorelli, Mathias Wallin, 2007 .

A Domain Decomposition Based Two-Level Newton Scheme for Nonlinear Problems

Daniel A. Tortorelli, Deepak V. Kulkarni, D. Tortorelli, 2005 .

Discontinuous Galerkin framework for adaptive solution of parabolic problems

Deepak V. Kulkarni, D. Rovas, D. Tortorelli, 2007 .

A discontinuous Galerkin formulation for solution of parabolic equations on nonconforming meshes

Deepak V. Kulkarni, D. Rovas, D. Tortorelli, 2007 .