Takeshi Uruma

Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy

Hidekazu Yamamoto, Futoshi Iwata, Nobuo Satoh, 2018, 2018 International Symposium on Micro-NanoMechatronics and Human Science (MHS).

Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

Hidekazu Yamamoto, Nobuo Satoh, Takeshi Uruma, 2016 .

Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Hidekazu Yamamoto, Nobuo Satoh, Takeshi Uruma, 2017 .