G.M. Swift

Characterization of Upset-Induced Degradation of Error-Mitigated High-Speed I/O's Using Fault Injection on SRAM Based FPGAs

S. Rezgui, G.M. Swift, A. Lesea, 2006, IEEE Transactions on Nuclear Science.

Upset Characterization and Test Methodology of the PowerPC405 Hard-Core Processor Embedded in Xilinx Field Programmable Gate Arrays

G.M. Swift, G.R. Allen, G. Miller, 2007, 2007 IEEE Radiation Effects Data Workshop.

Static Upset Characteristics of the 90nm Virtex-4QV FPGAs

C. Carmichael, Chen Wei Tseng, G.M. Swift, 2008, 2008 IEEE Radiation Effects Data Workshop.

SEU-Susceptibility of Logical Constants in Xilinx FPGA Designs

Chen Wei Tseng, G.M. Swift, G.R. Allen, 2009, IEEE Transactions on Nuclear Science.

Single Event Effects Test Results for Advanced Field Programmable Gate Arrays

G.M. Swift, G.R. Allen, G. Swift, 2006, 2006 IEEE Radiation Effects Data Workshop.

Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)

C. Carmichael, G.M. Swift, A. Lesea, 2004, IEEE Transactions on Nuclear Science.