Byung-Sick Moon

An Area-Efficient, Low-VDD, Highly Reliable Multi-Cell Antifuse System Fully Operative in DRAMs

Soo-Won Kim, Young-Hyun Jun, Jong-Pil Son, 2011, IEICE Trans. Electron..

A highly reliable multi-cell antifuse scheme using DRAM cell capacitors

Soo-Won Kim, Young-Hyun Jun, Jong-Pil Son, 2010, 2010 Proceedings of ESSCIRC.

A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme

Young Choi, Jung-Hwan Choi, Jongeun Lee, 2012, 2012 IEEE International Solid-State Circuits Conference.