M.-H. Gentil

A new high level testability measure: description and evaluation

Abdennour El Rhalibi, Didier Crestani, C. Durante, 1994, Proceedings of IEEE VLSI Test Symposium.

Control logic modelling scheme well suited to test problem

C. Durante, D. Crestani, P. Chardon, 1991 .

A Hierarchical Test Generation Using High Level primitives

Didier Crestani, C. Durante, M.-H. Gentil, 1993, The Sixth International Conference on VLSI Design.

Using GRAI Perf to design and implement a quality performance indicator system in accordance with the new ISO 9000:2000 standards

G. Doumeingts, Y. Ducq, M.-H. Gentil, 2002, IEEE International Conference on Systems, Man and Cybernetics.

Automatic partitioning for deterministic test

Didier Crestani, C. Durante, P. Chardon, 1992, Proceedings EURO-DAC '92: European Design Automation Conference.