Wayne M. Needham

DFT strategy for Intel microprocessors

Wayne M. Needham, Naga Gollakota, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Just how real is the SIA roadmap

Wayne M. Needham, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

High volume microprocessor test escapes, an analysis of defects our tests are missing

Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Microprocessor Test and Validation: Any New Avenues?

Jacob A. Abraham, Magdy S. Abadir, Hong Hao, 1997, VTS.

Best Methods for At-Speed Testing?

Peter C. Maxwell, Alfred L. Crouch, Wayne M. Needham, 1998, VTS.

Nanometer Technology Challenges for Test and Test Equipment

Wayne M. Needham, 1999, Computer.

Guest Editor's Introduction: Microprocessor Testing Today

Wayne M. Needham, 1998, IEEE Des. Test Comput..

So what is an optimal test mix? A discussion of the SEMATECH methods experiment

Kenneth M. Butler, Robert C. Aitken, Wojciech Maly, 1997, Proceedings International Test Conference 1997.