Donald R. Wall

发表

Machine learning and predictive data analytics enabling metrology and process control in IC fabrication

Todd C. Bailey, Yunlin Zhang, Narender Rana, 2015, Advanced Lithography.

Removal of Carbonaceous Residue with Wet Hydrogen in Greensheet Processing for Multilayer Ceramic Module: I, Residue Formation and Intrinsic Chemical Kinetics

Donald R. Wall, Hong Y. Sohn, 1990 .