A. T. Hatzopoulos

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors

C. A. Dimitriadis, G. Kamarinos, Dimitrios H. Tassis, 2006, Microelectron. Reliab..

Thermal impedance measurement of integrated inductors on bulk silicon substrate

G. De Mey, Boguslaw Wiecek, V. Chatziathanasiou, 2017, Microelectron. Reliab..

Effects of hot carriers in offset gated polysilicon thin-film transistors

C. A. Dimitriadis, G. Kamarinos, Dimitrios H. Tassis, 2006, Microelectron. Reliab..

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress

C. A. Dimitriadis, G. Kamarinos, Dimitrios H. Tassis, 2008, Microelectron. Reliab..

1/f noise characterization of amorphous/nanocrystalline silicon bilayer thin-film transistors

François Templier, Dimitrios H. Tassis, Charalabos A. Dimitriadis, 2007 .

Electrical and noise characterization of bottom-gated nanocrystalline silicon thin-film transistors

François Templier, Dimitrios H. Tassis, Charalabos A. Dimitriadis, 2006 .

A simple and continuous polycrystalline silicon thin-film transistor model for SPICE implementation

S. Siskos, I. Pappas, Dimitrios H. Tassis, 2006 .