Jeffrey H. Dreibelbis

Processor-based built-in self-test for embedded DRAM

Howard Leo Kalter, John E. Barth, Jeffrey H. Dreibelbis, 1998, IEEE J. Solid State Circuits.

Introduction to the memory section

Jeffrey H. Dreibelbis, 1998 .

Guest Paper--IBM Journal of Research and Developmentから IBM社,第3世代埋め込みDRAMを開発--実効チャネル長0.07μmのASIC混載を想定

John E. Barth, Erik A. Nelson, Jeffrey H. Dreibelbis, 2003 .