Shoji Inoue
发表
Kiyoshi Nikawa,
Shoji Inoue,
1997
.
Killer defect detection using the IR-OBIRCH (infrared optical-beam-induced resistance-change) method
Shoji Inoue,
K. Nikawa,
K. Morimoto,
1999,
1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314).
Shoji Inoue,
Takayoshi Nakayama,
Saburo Okuno,
2001
.
Shoji Inoue,
Tomonori Murakami,
Ryoichi Hiroshige,
2016
.
Shoji Inoue,
Takahiro Fujiwara,
Hiroshi Yoshioka,
2002
.
Kiyoshi Nikawa,
Shoji Inoue,
Kazuyuki Morimoto,
2000
.
Kiyoshi Nikawa,
Shoji Inoue,
1998
.
Kiyoshi Nikawa,
Shoji Inoue,
Kazuyuki Morimoto,
1999,
Proceedings Eighth Asian Test Symposium (ATS'99).
Kiyoshi Nikawa,
Shoji Inoue,
Kazuyuki Morimoto,
1999,
Asian Test Symposium.
Shoji Inoue,
Yohei Nagatake,
Yasufumi Limura,
2012
.
Toru Matsumoto,
Katsuyoshi Miura,
Koji Nakamae,
2009,
IEICE Trans. Electron..
Kiyoshi Nikawa,
Shoji Inoue,
K. Nikawa,
1997,
Proceedings Sixth Asian Test Symposium (ATS'97).
Shoji Inoue,
Hideo Iio,
T. Goto,
1975
.