J.A. Jargon

Repeat measurements and metrics for nonlinear model development

K.A. Remley, J.A. Jargon, D. Schreurs, 2002, 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278).

Repeatability study of commercial harmonic phase standards measured by a nonlinear vector network analyzer

J.A. Jargon, D.C. DeGroot, D.F. Vecchia, 2003, Conference, 2003. Fall 2003. 62nd ARFTG Microwave Measurements.

Artificial neural network model for HEMTs constructed from large-signal time-domain measurements

J.A. Jargon, D.C. DeGroot, K.C. Gupta, 2002, 59th ARFTG Conference Digest, Spring 2002..

Microwave characterization of flip-chip MMIC interconnections

J.A. Jargon, R.B. Marks, C.K. Pao, 1995, Proceedings of 1995 IEEE MTT-S International Microwave Symposium.

Design and characterization of a superconducting nonlinear reference device

J.A. Jargon, D.C. DeGroot, J.C. Booth, 2003, Conference, 2003. Fall 2003. 62nd ARFTG Microwave Measurements.

Optical performance monitoring by use of artificial neural networks trained with parameters derived from delay-tap asynchronous sampling

Xiaoxia Wu, A.E. Willner, J.A. Jargon, 2009, 2009 Conference on Optical Fiber Communication - incudes post deadline papers.

NIST passive intermodulation measurement comparison for wireless base station equipment

J.A. Jargon, D.C. DeGroot, K.L. Reed, 1998, 52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics (IEEE Cat. No.98EX245).

Applications of Artificial Neural Networks in Optical Performance Monitoring

Xiaoxia Wu, A.E. Willner, L. Paraschis, 2009, Journal of Lightwave Technology.

A method to compare vector nonlinear network analyzers

K.A. Remley, J.A. Jargon, K.C. Gupta, 2001, 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157).

Accuracy of lumped-element calibrations for four-sampler vector network analyzers

J.A. Jargon, R.B. Marks, D.K. Rytting, 1998, 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192).

Multiline TRL revealed

J.A. Jargon, D.C. DeGroot, R.B. Marks, 2002, 60th ARFTG Conference Digest, Fall 2002..

Optical Performance Monitoring Using Artificial Neural Networks Trained With Eye-Diagram Parameters

A.E. Willner, J.A. Jargon, Xiaoxia Wu, 2009, IEEE Photonics Technology Letters.