Ann Concannon

Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique

Akram A. Salman, Farzan Farbiz, Ann Concannon, 2016, Microelectron. Reliab..

RF ESD protection strategies - the design and performance trade-off challenges

Dimitri Linten, Steven Thijs, Guido Groeseneken, 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..

HBM failures induced by ESD cell turn-off and circuit interaction with ESD protection

Ann Concannon, Yang Xiao, Rajkumar Sankaralingam, 2015, 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Technology CAD evaluation of BiCMOS protection structures operation including spatial thermal runaway

Vladislav Vashchenko, Peter Hopper, Ann Concannon, 2002, 2002 Electrical Overstress/Electrostatic Discharge Symposium.

A CAD assisted design and optimisation methodology for over-voltage ESD protection circuits

Michiel Steyaert, Guido Groeseneken, J.-J. Yang, 2004, Microelectron. Reliab..

Impact of sub-threshold SOA on ESD protection schemes

Ann Concannon, Lihui Wang, Antonio Gallerano, 2016, 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Mutual ballasting: A novel technique for improved inductive system level IEC ESD stress performance for automotive applications

Akram A. Salman, Farzan Farbiz, Ann Concannon, 2013, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium.

Investigation of reverse recovery effects on the SOA of integrated high frequency power transistors

Farzan Farbiz, Ann Concannon, Akram Salman, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

LVTSCR structures for latch-up free ESD protection of BiCMOS RF circuits

Ann Concannon, Vladislav A. Vashchenko, Marcel ter Beek, 2003, Microelectron. Reliab..

Quasi-3D simulation approach for comparative evaluation of triggering ESD protection structures

Ann Concannon, Vladislav A. Vashchenko, Marcel ter Beek, 2003, Microelectron. Reliab..

Identification of two-probe TLP contact resistance issues and proposed solutions

Ann Concannon, Hans Kunz, Jonathan Brodsky, 2014, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.