J. Siegel

A versatile 3.3 V/2.5 V/1.8 V CMOS I/O driver built in a 0.2 /spl mu/m 3.5 nm Tox 1.8 V CMOS technology

H. Sanchez, C. Nicoletta, G. Gerosa, 1999, 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278).