Giuseppe La Rosa

Introduction to the Special Issue on Negative Bias Temperature Instability

Giuseppe La Rosa, Anand Krishnan, 2007 .

Process technology for IBM 14-nm processor designs featuring silicon-on-insulator FinFETs

Paul C. Parries, Giuseppe La Rosa, Scott R. Stiffler, 2018, IBM J. Res. Dev..

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission

Franco Stellari, Keith A. Jenkins, Alan J. Weger, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies

Giuseppe La Rosa, Stewart E. Rauch, S. Rauch, 2007, Microelectron. Reliab..

A review of hot-carrier degradation mechanisms in MOSFETs

Giuseppe La Rosa, Alexander Acovic, Yuan-Chen Sun, 1996 .

Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

Barry P. Linder, James H. Stathis, Giuseppe La Rosa, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

A Novel End-Effector System to Enable Pro-Supination Movements During Robot-Assisted Upper-Limb Training

Paolo Bonato, Giuseppe La Rosa, Paul Sassaman, 2019 .