Magdalena Moczała

发表

Silicon nanowires reliability and robustness investigation using AFM-based techniques

Adrian M. Ionescu, Teodor Gotszalk, Tomasz Bieniek, 2013, Electron Technology Conference.

Microcontact printing technology as a method of fabrication of patterned self-assembled monolayers for application in nanometrology

Teodor Gotszalk, Paweł Janus, Piotr Grabiec, 2013, Electron Technology Conference.