Paul J. van der Wel

With electroluminescence microcopy towards more reliable AlGaN/GaN transistors

Stefan Müller, Michael Mikulla, Joachim Wagner, 2015, SPIE NanoScience + Engineering.

Electromigration behavior in aluminum wires for power base-station applications

Paul J. van der Wel, Harry Roberts, Frank de Bruijn, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).