Wolfgang Mertin

发表

Cross-talk in electric force microscopy testing of parallel sub-micrometer conducting lines

U. Behnke, Wolfgang Mertin, Erich Kubalek, 2000 .

Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope

Wolfgang Mertin, Erich Kubalek, Michael Hietschold, 2002, Microelectron. Reliab..

Probe tip invasiveness at indirect electro-optic sampling of MMIC

Wolfgang Mertin, Erich Kubalek, C. Roths, 1993, 1993 IEEE MTT-S International Microwave Symposium Digest.

Micromachined probes for high-frequency scanning force microscopy and scanning thermal microscopy

Egbert Oesterschulze, Wolfgang Mertin, Michael Stopka, 1997, Photonics West.

Elektrische Signale in Mikrobauteilen: Messungen mit dem Rastersondenmikroskop

Wolfgang Mertin, Erich Kubalek, M. A. Klein, 1999 .

Circuit-internal signal measurements with a needle sensor

Wolfgang Mertin, Claus Hartmann, Gerd Bacher, 2005, Microelectron. Reliab..

Cantilever influence suppression of contactless IC-testing by electric force microscopy

U. Behnke, Wolfgang Mertin, V. Wittpahl, 1998 .

Voltage contrast measurements on sub-micrometer structures with an electric force microscope based test system

U. Behnke, Wolfgang Mertin, Erich Kubalek, 1999 .

Voltage-influence of biased interconnection line on integrated circuit-internal current contrast measurements via magnetic force microscopy

Wolfgang Mertin, Erich Kubalek, Rainer Weber, 2000 .

Investigation of the electrical activity of V-defects in GaN using scanning force microscopy

Wolfgang Mertin, Gerd Bacher, André Lochthofen, 2009, OPTO.

Kelvin force microscopy on a (Al1-xGax)0.5In0.5P light-emitting diode

Wolfgang Mertin, Klaus Streubel, Arndt Jaeger, 2006, SPIE OPTO.

Two-dimensional field mapping in MMIC-substrates by electro-optic sampling technique

Wolfgang Mertin, Erich Kubalek, L. J. Balk, 1992, 1992 IEEE Microwave Symposium Digest MTT-S.

A new technique for contactless current contrast imaging of high frequency signals

Wolfgang Mertin, Erich Kubalek, Rainer Weber, 2003, Microelectron. Reliab..

Contactless current and voltage measurements in integrated circuits by using a needle sensor

Wolfgang Mertin, Erich Kubalek, Rainer Weber, 2002, Microelectron. Reliab..

Contactless gigahertz testing

Wolfgang Mertin, Ulf Behnke, Anton Leyk, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Degradation studies of InGaN/GaN heterostructure laser diodes using a Kelvin Force Microscope

Uwe Strauss, Wolfgang Mertin, Georg Brüderl, 2007, SPIE OPTO.

Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz

U. Behnke, Wolfgang Mertin, Erich Kubalek, 1999 .

Local voltage drop in a single functionalized graphene sheet characterized by Kelvin probe force microscopy.

Wolfgang Mertin, Christian Punckt, Gerd Bacher, 2011, Nano letters.

Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy

Wolfgang Mertin, Berthold Hahn, Gerd Bacher, 2008 .

A new bifunctional topography and current probe for scanning force microscope testing of integrated circuits

Wolfgang Mertin, Erich Kubalek, Seong-Woo Bae, 1999 .

Monolithic gallium arsenide cantilever for scanning near-field microscopy

Egbert Oesterschulze, Wolfgang Mertin, A. Leyk, 1998 .