Jens Braun

A memory specific notation for fault modeling

Ad J. van de Goor, Zaid Al-Ars, Detlev Richter, 2001, Proceedings 10th Asian Test Symposium.

Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs

Zaid Al-Ars, A. J. van de Goor, Detlev Richter, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).