N. Nolhier
发表
J. Bordeneuve,
C. Ganibal,
J.-M. Dilhac,
1992
.
P. Renaud,
N. Nolhier,
A. Gendron,
2007,
2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.
F. Caignet,
N. Nolhier,
M. Bafleur,
2011,
10th International Symposium on Electromagnetic Compatibility.
N. Nolhier,
P. Rossel,
G. Charitat,
1996,
1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings.
C. Ganibal,
Jean-Marie Dilhac,
N. Nolhier,
1991,
Other Conferences.
C. Viallon,
N. Nolhier,
A. Fernandez,
2016,
2016 IEEE Avionics and Vehicle Fiber-Optics and Photonics Conference (AVFOP).
F. Caignet,
N. Nolhier,
M. Bafleur,
2014,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.
P. Renaud,
N. Nolhier,
A. Gendron,
2006,
2006 Bipolar/BiCMOS Circuits and Technology Meeting.
N. Nolhier,
M. Bafleur,
D. Tremouilles,
2009,
2009 31st EOS/ESD Symposium.
N. Nolhier,
D. Tremouilles,
G. Bertrand,
2003,
2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).
N. Nolhier,
P. Rossel,
B. Beydoun,
1993,
ESSDERC '93: 23rd European solid State Device Research Conference.
N. Nolhier,
F. Morancho,
P. Calmon,
2005
.
C. Ganibal,
Jean-Marie Dilhac,
N. Nolhier,
1993,
Other Conferences.
N. Nolhier,
M. Bafleur,
C. Salamero,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
N. Nolhier,
C. Delage,
M. Bafleur,
1998,
Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.98CH36198).
F. Caignet,
N. Nolhier,
M. Bafleur,
2012,
2012 Asia-Pacific Symposium on Electromagnetic Compatibility.
N. Nolhier,
M. Bafleur,
A. Gendron,
2010,
2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
N. Nolhier,
M. Bafleur,
D. Tremouilles,
2004,
IEEE Journal of Solid-State Circuits.
N. Nolhier,
A. Gendron,
M. Bafleur,
2006,
IEEE Transactions on Device and Materials Reliability.
N. Nolhier,
P. Perdu,
V. Pouget,
2005,
Microelectron. Reliab..
R. Plana,
N. Nolhier,
D. Tremouilles,
2009,
2009 31st EOS/ESD Symposium.
F. Caignet,
N. Nolhier,
F. Lafon,
2011,
EOS/ESD Symposium Proceedings.
F. Caignet,
N. Nolhier,
M. Bafleur,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
P. Renaud,
N. Nolhier,
P. Besse,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
F. Caignet,
N. Nolhier,
M. Bafleur,
2012,
IEEE Transactions on Device and Materials Reliability.
N. Nolhier,
M. Bafleur,
C. Salamero,
2005,
Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..
N. Nolhier,
H. Tranduc,
P. Rossel,
1999
.
C. Ganibal,
Jean-Marie Dilhac,
N. Nolhier,
1995
.
F. Caignet,
N. Nolhier,
M. Bafleur,
2013,
IEEE Transactions on Electromagnetic Compatibility.
C. Ganibal,
N. Nolhier,
J-M. Dilhac,
1990
.