D. P. Vallett

Future challenges in IC testing and fault isolation

D. P. Vallett, 2003, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003..

Failure analysis requirements for nanoelectronics

D. P. Vallett, 2002 .

Failure analysis requirements for nanoelectronics

D. P. Vallett, 2002, Proceedings of the 2nd IEEE Conference on Nanotechnology.

Finding fault with deep-submicron ICs

D. P. Vallett, J. M. Soden, 1997 .