K. Saeki

Image Processing System for Power Plant

S. Kuroda, T. Takenaka, M. Kimura, 1995 .

Process check time reduction by the application of an in-line thin film thickness measurement tool

K. Murata, K. Saeki, 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..

Optical property of infrared-FELs at the FELI

Kobayashi Akira, Takio Tomimasu, S. Okuma, 1996 .

Degradation and restoration of dielectric-coated cavity mirrors in the NIJI-IV FEL

Tomohisa Mikado, Hideaki Ohgaki, Tetsuo Yamazaki, 1995 .