K. Tai

A 100-CHANNEL PULSE AMPLITUDE ANALYZER

H. Ts'ai, K. Tai, 1965 .

Grain‐boundary electromigration in thin films II. Tracer measurements in pure Au

Milton Ohring, K. Tai, M. Ohring, 1977 .

Electromigration in conductor stripes under pulsed dc powering

P. A. Turner, K. Tai, A. T. English, 1972 .

Study of Ni as a barrier metal in AuSn soldering application for laser chip/submount assembly

Yiu-Man Wong, K. Tai, Avishay Katz, 1992 .

Electromigration of Ti–Au thin‐film conductors at 180° C

P. A. Turner, K. Tai, A. T. English, 1974 .