Giovanni Nicoletti

Recovering contacting interfaces in packaging and in semiconductor devices: Mechanisms and how to handle them in analysis

Peter Jacob, Christina Pecnik, Giovanni Nicoletti, 2016, 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Design and reliability aspects of multilevel metal large-scale power line layouts in ULSI-ICs

Peter Jacob, Giovanni Nicoletti, 2000, SPIE Advanced Lithography.

Device decapsulated (and/or depassivated) - Retest ok - What happened?

Peter Jacob, Giovanni Nicoletti, Florian Hauf, 2007, Microelectron. Reliab..

Reading distance degradation mechanisms of near-field RFID devices

Peter Jacob, Giovanni Nicoletti, Willy Knecht, 2009, Microelectron. Reliab..

Perforator flaps: Current concept and definition

Giovanni Nicoletti, Angela Faga, M Carminati, 2001 .

Failure causes generating aluminium protrusion/extrusion

Peter Jacob, Giovanni Nicoletti, 2013, Microelectron. Reliab..

A technical and environmental comparison between hydrogen and some fossil fuels

Giovanni Nicoletti, Natale Arcuri, Roberto Bruno, 2015 .

Reliability and wearout characterisation of LEDs

Peter Jacob, Giovanni Nicoletti, Albert Kunz, 2006, Microelectron. Reliab..

L'impatto ambientale dei combustibili generalmente impiegati per il riscaldamento urbano degli edifici

Giovanni Nicoletti, 2001 .