Maximilian Haider

发表

Progress on the Development of a Cc/Cs Corrector for TEAM

Peter Hartel, Heiko Müller, Maximilian Haider, 2008 .

Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope

Bernd Kabius, Maximilian Haider, Stephan Uhlemann, 1998 .

A versatile, software configurable multichannel STEM detector for angle-resolved imaging

P. Jarron, A. Epstein, C. Boulin, 1994 .

Electron microscopy image enhanced

Bernd Kabius, Maximilian Haider, Stephan Uhlemann, 1998, Nature.

CHAPTER 2 – Present and Future Hexapole Aberration Correctors for High-Resolution Electron Microscopy

Maximilian Haider, Stephan Uhlemann, M. Haider, 2008 .

First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM

Peter Hartel, Bernd Kabius, Maximilian Haider, 2009, Microscopy and Microanalysis.

Aberration correction in a low voltage SEM by a multipole corrector

Maximilian Haider, M. Haider, J. Zach, 1995 .

Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

Maximilian Haider, Stephan Uhlemann, M. Haider, 1998 .

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM.

Peter Hartel, Bernd Kabius, Maximilian Haider, 2009, Journal of electron microscopy.

Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope

Peter Hartel, Maximilian Haider, Stephan Uhlemann, 2006, Microscopy and Microanalysis.