Oskar Kowarik

Modelling the Field Soft Error Rate of DRAMs by varying the critical cell Charge

Horst Schleifer, Oskar Kowarik, Kurt Hoffmann, 1998 .

A non-linear description of the bias dependent parasitic resistances of quarter micron MOSFETs

Oskar Kowarik, P. Klein, E. Gondro, 1998, ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187).

Associative and data processing Mbit-DRAM

Oskar Kowarik, Kurt Hoffmann, Rainer Kraus, 1990, Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors.

An EEPROM compact circuit model

Oskar Kowarik, Kurt Hoffmann, P. Klein, 1996, Proceedings of Custom Integrated Circuits Conference.

Design for test of Mbit DRAMs

Oskar Kowarik, Dieter Oberle, Kurt Hoffmann, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

Dram type integrated semiconductor memory and its inspection method

Oskar Kowarik, Kurt Hoffmann, Rainer Kraus, 1990 .

BSIM3v3 based degradation compact model for circuit simulation of non-volatile flash memories

Oskar Kowarik, Kurt Hoffmann, F. Schuler, 1998, ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187).

Redundant decoder for integrated semiconductor memory

Oskar Kowarik, Rainer Kraus, Kurt Hoffmann, 1989 .

4922134 Testable redundancy decoder of an integrated semiconductor memory

Oskar Kowarik, Rainer Kraus, Kurt Hoffmann, 1991 .