T. E. Turner

A step-by-step method for elimination of burn-in as a necessary screen

T. E. Turner, 1996, 1996 International Integrated Reliability Workshop Final Report.

Wafer level reliability: process control for reliability

T. E. Turner, 1996 .

Integrated imaging : a strategic information systems weapon

T. E. Turner, 1991 .

Application of the deterministic-spectral fatigue analysis method using platforms operating in non-linear wave loading conditions

N. W. M. Bishop, M. G. Kirkwood, T. E. Turner, 1996 .