Jinhyun Noh

Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices

Soonyoung Lee, Jongwoo Park, Sangwoo Pae, 2015, 2015 IEEE International Reliability Physics Symposium.

The Impact of Substrates on the Performance of Top-Gate p-Ga203 Field-Effect Transistors: Record High Drain Current of 980 mA/mm on Diamond

Mengwei Si, Peide D. Ye, Marko J. Tadjer, 2018, 2018 76th Device Research Conference (DRC).

Low dissipation spectral filtering using a field-effect tunable III–V hybrid metasurface

Stephen W. Howell, Peide D. Ye, Joshua Shank, 2018, Applied Physics Letters.

Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs

Dan Alexandrescu, Soonyoung Lee, Issam Nofal, 2015, IEEE Transactions on Nuclear Science.