Staffan Greek

Strength of indium-phosphide-based microstructures

Michel Gendry, Pierre Viktorovitch, Christian Seassal, 1997, Photonics West.

Tensile testing of thin-film microstructures

Staffan Greek, Stefan A. I. Johansson, 1997, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

In Situ Tensile Strength Measurement Of Thick-film And Thin Film Micromacrined Structures

Jan-Åke Schweitz, Staffan Greek, Fredric Ericson, 1995, Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95.

Weibull fracture probability for silicon wafer bond evaluation

Lars Stenmark, Kerstin Jonsson, Johan Köhler, 2000 .

Deflection of surface-micromachined devices due to internal, homogeneous or gradient stresses

Staffan Greek, S. Greek, N. Chitica, 1999 .

In situ tensile strength measurement and Weibull analysis of thick film and thin film micromachined polysilicon structures

Stefan Johansson, Jan-Åke Schweitz, Staffan Greek, 1997 .