M. S. B. Sowariraj

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2003, Microelectron. Reliab..

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2002, Microelectron. Reliab..

A 3-D Circuit Model to evaluate CDM performance of ICs

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2005, Microelectron. Reliab..