R.J.O.M. Hoofman

From Sensor Output to Improved Product Quality

Maarten Hertog, Jeroen Lammertyn, Martijntje Vollebregt, 2015 .

Impact of the barrier/dielectric interface quality on reliability of Cu porous-low-k interconnects

S. Demuynck, P. Roussel, K. Maex, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Moisture influence on porous low-k reliability

J. Michelon, R.J.O.M. Hoofman, R. Hoofman, 2006, IEEE Transactions on Device and Materials Reliability.

Comparison of n- and p-type high efficiency silicon solar cell performance under low illumination conditions

Niels Posthuma, Jef Poortmans, Frederic Dross, 2008, 2008 33rd IEEE Photovoltaic Specialists Conference.