Cristina Africh

The FAST module: an add-on unit for driving commercial scanning probe microscopes at video rate and beyond.

Giuseppe Cautero, D. Giuressi, Alessio Spessot, 2011, The Review of scientific instruments.

Electron Localization Determines Defect Formation on Ceria Substrates

Ling Zhou, Paolo Fornasiero, Stefano Fabris, 2005, Science.

Scanning tunnelling microscopy investigations of simple surface reactions on Rh(110)

Giovanni Comelli, Cristina Africh, C. Africh, 2006 .

Activation of Cu(111) surface by decomposition into nanoclusters driven by CO adsorption

Lin-Wang Wang, Gabor A. Somorjai, Cheng Hao Wu, 2016, Science.