Benoit Dubois

Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability

Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun, 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).

Modelling of hot-carrier degradation and its application for analog design for reliability

Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun, 2009, Microelectron. J..

Ageing sensor for analog application

Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun, 2009, 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference.