V. Dattilo

Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines

Alan Mathewson, Bruno Neri, Carmine Ciofi, 1999 .

Comments on the utilization of noise measurements for the characterization of electromigration in metal lines

Bruno Neri, Carmine Ciofi, V. Dattilo, 1997 .

Low frequency noise evolution during lifetime tests of lines and vias subjected to electromigration

Bruno Neri, Carmine Ciofi, V. Dattilo, 2000 .