Du Yankang

Simulation Study of Node-State Transition Effect on the Single-Event Transient

Liu Biwei, Du Yankang, Li Zhao, 2015, IEEE Transactions on Device and Materials Reliability.

PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level

Huang Pengcheng, Chen Shuming, Du Yankang, 2015, IEEE Transactions on Device and Materials Reliability.

Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Chen Shuming, Liu Biwei, Du Yankang, 2013 .

Mitigating the SERs of Large Combinational Circuits by Using Half Guard Band Technique in CMOS Bulk Technology

Xu Hui, Du Yankang, Liang Bin, 2014 .

A mixed-mode simulation method and tool for computing SER in combinational logic

Du Yankang, 2012 .

A mixed-level framework to estimate SER induced by SEMT in advanced technologies

Liu Biwei, Du Yankang, Wang Liping, 2015 .

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology

Chen Shuming, Liu Biwei, Du Yankang, 2012, IEEE Transactions on Nuclear Science.